Fault-based product-line testing: effective sample generation based on feature-diagram mutation (bibtex)
by Dennis Reuling, Johannes Bürdek, Serge Rotärmel, Malte Lochau and Udo Kelter
Reference:
Fault-based product-line testing: effective sample generation based on feature-diagram mutation (Dennis Reuling, Johannes Bürdek, Serge Rotärmel, Malte Lochau and Udo Kelter), In Proceedings of the 19th International Conference on Software Product Line, 2015.
Bibtex Entry:
@InProceedings{DBLP:conf/splc/ReulingBRLK15,
  Title                    = {Fault-based product-line testing: effective sample generation based on feature-diagram mutation},
  Author                   = {Dennis Reuling and Johannes B{\"{u}}rdek and Serge Rot{\"{a}}rmel and Malte Lochau and Udo Kelter},
  Booktitle                = {Proceedings of the 19th International Conference on Software Product Line},
  Year                     = {2015},
  Pages                    = {131--140},

  Doi                      = {10.1145/2791060.2791074},
  Url                      = {http://doi.acm.org/10.1145/2791060.2791074}
}
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