Generalizing fault contents from a few classes (bibtex)
by Scott, Hanna and Johnson, Philip M.
Abstract:
The challenges in fault prediction today are to get a prediction as early as possible, at as low a cost as possible, needing as little data as possible and preferably in such a language that your average developer can understand where it came from. This paper presents a fault sampling method where a summary of a few, easily available metrics is used together with the results of a few sampled classes to generalize the fault content to an entire system. The method is tested on a large software system written in Java, that currently consists of around 2000 classes and 300,000 lines of code. The evaluation shows that the fault generalization method is good at predicting fault-prone clusters and that it is possible to generalize the values of a few representative classes.
Reference:
Generalizing fault contents from a few classes (Scott, Hanna and Johnson, Philip M.), In Proceedings - 1st International Symposium on Empirical Software Engineering and Measurement, ESEM 2007, 2007.
Bibtex Entry:
@inproceedings{Izurieta2007,
abstract = {The challenges in fault prediction today are to get a prediction as early as possible, at as low a cost as possible, needing as little data as possible and preferably in such a language that your average developer can understand where it came from. This paper presents a fault sampling method where a summary of a few, easily available metrics is used together with the results of a few sampled classes to generalize the fault content to an entire system. The method is tested on a large software system written in Java, that currently consists of around 2000 classes and 300,000 lines of code. The evaluation shows that the fault generalization method is good at predicting fault-prone clusters and that it is possible to generalize the values of a few representative classes.},
author = {Scott, Hanna and Johnson, Philip M.},
booktitle = {Proceedings - 1st International Symposium on Empirical Software Engineering and Measurement, ESEM 2007},
doi = {10.1109/ESEM.2007.55},
isbn = {0769528864},
issn = {1938-6451},
keywords = {cocome_lit-review,design;object-oriented programming;design pattern realization;object oriented systems;pattern evolution;software designs decay;Aging;Computer science;Cost function;Open source software;Permission;Software design;Software engineering;Software measurement;Software systems;Testing;Decay;Evolution;Open Source Software;Software;Software Engineering;Software Grime Buildup.},
mendeley-tags = {cocome_lit-review},
pages = {205--214},
title = {{Generalizing fault contents from a few classes}},
year = {2007}
}
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