by Lity, Sascha, Nahrendorf, Sophia, Thüm, Thomas, Seidl, Christoph and Schaefer, Ina
Reference:
175% Modeling for Product-Line Evolution of Domain Artifacts (Lity, Sascha, Nahrendorf, Sophia, Thüm, Thomas, Seidl, Christoph and Schaefer, Ina), In Proceedings of the 12th International Workshop on Variability Modelling of Software-Intensive Systems, ACM, 2018.
Bibtex Entry:
@InProceedings{Lity2018,
Title = {{175{\%} Modeling for Product-Line Evolution of Domain Artifacts}},
Author = {Lity, Sascha and Nahrendorf, Sophia and Th\"{u}m, Thomas and Seidl, Christoph and Schaefer, Ina},
Booktitle = {Proceedings of the 12th International Workshop on Variability Modelling of Software-Intensive Systems},
Year = {2018},
Address = {New York, NY, USA},
Pages = {27--34},
Publisher = {ACM},
Series = {VAMOS 2018},
Acmid = {3168369},
Doi = {10.1145/3168365.3168369},
ISBN = {978-1-4503-5398-4},
Keywords = {Software Evolution, Software Product Lines, Variability Modeling},
Location = {Madrid, Spain},
Numpages = {8},
Owner = {Lity},
Timestamp = {2018.02.14},
Url = {http://doi.acm.org/10.1145/3168365.3168369}
}